Suyong Kwon, Yong-Gyoo Kim,Sanghyun Lee, Jong Chul Kim
MEASUREMENT OF THE FIGURE-OF-MERIT OF THERMOELECTRIC DEVICES
The apparatus for evaluation of the figure of merit (ZT) of thermoelectric devices has been developed. ZT value is comprised of three physical quantities, Seebeck coefficient, electrical conductivity, and thermal conductivity. However, to date, the ZT values of the thermoelectric devices have been evaluated by Harman method due to difficulty in measuring thermal conductivity of the devices with high accuracy. In this study, we present new apparatus developed for evaluating the thermoelectric figure of merit of devices by direct measurement of thermal conductivity using guarded hot plate method.