A DSP BASED TEST SYSTEM FOR 'NOISE-SEPARATION' MEASUREMENTS ON ADC AND DAC SYSTEMS
R A Belcher, C Asteriou, C J Bury, A Edwards, R Hall, G Lancelin, M Penny
Abstract:
This paper describes the design and application of a 'noise-separation' test system that uses in-system programmable logic devices and a digital signal processor. This offers a low cost approach to multi-tone testing of the wide-bandwidth linearity of both ADC and DAC systems. As the test signal bandwidth is software configurable and uses 1 bit D-A converters it can be applied to a much wider range of applications than more conventional multi-tone test methods. Time-domain processing is expected to provide meaningful results for routine tests in a much shorter time than with FFT analysis.
Keywords:
ADC, DAC, routine tests, multi-tone testing, NPR testing
Download:
IMEKO-TC4-2002-003.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
TC4 Conference and Workshop 2002
Title:
4th International Conference on Advanced A/D and D/A Conversion Techniques and their Applications (together with 7th IMEKO TC4 Workshop on ADC Modelling and Testing)
Place:
Prague, CZECH REPUBLIC
Time:
26 June 2002 - 28 June 2002
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