Bias-induced Impedance of Current-carrying Conductors: Measurements Simulation Using FRA |
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| Sioma Baltianski |
- Abstract:
- The paper presents mainly the simulation of impedance measurements utilizing a frequency response analyzer (FRA) for the study of the currentcarrying conductors under the influence of bias. It is vital to have confidence in the results of impedance spectroscopy because one of the informative quantities has very little impact on the resulting impedance. During the passage of an electric current, the studied objects have an additional low-frequency impedance called the bias-induced impedance effect (ZBI-effect) [1]. An emphasis was placed on explaining how the ZBIeffect acts as an amplifier for temperature modulation of a resistance caused by the test signal. A description of the investigated object is based on electrical models whose parameters provide useful information for further research. Several studies have been done to assess the consistency of electrical parameters. A silver wire was used in research as an object under study and as a representative of pure metals.
- Download:
- IMEKO-TC4-2022-46.pdf
- DOI:
- 10.21014/tc4-2022.46
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2022
- Title:
25th IMEKO TC4 Symposium and 23nd International Workshop on ADC and DAC Modelling and Testing (IWADC)
- Place:
- Brescia, ITALY
- Time:
- 12 September 2022 - 14 September 2022