FROM DIGITAL DEVICE UNDER TEST TO DIGITAL CALIBRATION CERTIFICATE. CHALLENGES AND SOLUTIONS FOR THE CALIBRATION OF MEASURING INSTRUMENTS AND SENSORS IN THE DIGITAL FUTURE |
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| Martin Nicklich, Michael Mende |
- Abstract:
- The digital transition challenges calibration laboratories on many levels. On the one hand, the test items are changing from analog sensors and measuring instruments to fully digital devices (DUT – devices under test) and, on the other hand, the analog printed calibration certificate is increasingly supplemented by digital data exchange or will be replaced by the DCC in the medium term. The authors have to deal with both challenges as manufacturers of calibration systems and as operators of an accredited calibration laboratory. This paper tries to show why both areas are closely linked and how SPEKTRA deals with it.
- Keywords:
- Digital transducers, calibration data handling, DCC
- Download:
- IMEKO-TC6-2022-020.pdf
- DOI:
- 10.21014/tc6-2022.020
- Event details
- Event name:
- M4Dconf2022
- Title:
First International IMEKO TC6 Conference on Metrology and Digital Transformation
- Place:
- Berlin, GERMANY
- Time:
- 19 September 2022 - 21 September 2022
- Event details
- Event name:
- Special session at M4Dconf2022
- Title:
First International IMEKO TC6 Conference on Metrology and Digital Transformation
- Place:
- Berlin, GERMANY
- Time:
- 19 September 2022 - 21 September 2022
- Event details
- Event name:
- M4Dconf2022 (2)
- Title:
First International IMEKO TC6 Conference on Metrology and Digital Transformation
- Place:
- Berlin, GERMANY
- Time:
- 19 September 2022 - 21 September 2022