TESTING VLSI CIRCUIT USING ARTIFICIAL IMMUNE SYSTEM |
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| C. P. Souza, R. C. S. Freire, F. M. Assis |
- Abstract:
- A VLSI circuit test scheme taking inspiration from the Human Immune System is presented. Such a scheme is based on the Negative-Selection Mechanism which provides the human body with the capability to discriminate between the self (body’s own cell) and any foreign cell (non-self). Based on this, it is design a output response analyzer which is able to evaluate is the circuit is faulty. Experimental results showing the effectively of the proposed scheme are presented.
- Keywords:
- VLSI circuit testing, output response analyzer, artificial immune system
- Download:
- PWC-2006-TC10-002u.pdf
- DOI:
- -
- Event details
- Event name:
- XVIII IMEKO World Congress
- Title:
Metrology for a Sustainable Development
- Place:
- Rio de Janeiro, BRAZIL
- Time:
- 17 September 2006 - 22 September 2006