MCX: a beamline for non-destructive X-ray diffraction experiments used to study stained glass windows

J. R. Plaisier, A. Lausi, L. Nodari
Abstract:
The MCX beamline at the synchrotron Elettra is the general purpose diffraction beamline that is well suited for non-destructive and innovative X-ray diffraction (XRD) experiments in the field of cultural heritage. A comprehensive study of the alteration products in grisaille paints was recently performed at the beamline. Such a study is very important to understand the complex processes involved in the deterioration of this type of glass decoration. An exhaustive characterization of these products and so a full understanding of the mechanism of their formation may lead to the development of new protective materials for conservation and restoration. XRD experiments at the MCX beamline allowed us to recognize the alteration products on the grisailles surface and to propose a mechanism for the formation of alteration patinae. Here we present the beamline and its capabilities by showing an example of the study on grisaille paints.
Download:
IMEKO-TC4-ARCHAEO-2016-31.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
MetroArchaeo 2016
Title:

International Conference on Metrology for Archaeology and Cultural heritage (TC4)

Place:
Torino, ITALY
Time:
19 October 2016 - 21 October 2016