DESIGN OF A MULTI-WAVE STANDARD TO EVALUATE THE FREQUENCY RESPONSE OF CT MEASURING SYSTEMS |
|---|
| Francisco A. Arenhart, Vitor C. Nardelli, Gustavo D. Donatelli, Mauricio C. Porath, Christopher Isenberg, Robert Schmitt |
- Abstract:
- This paper presents a multi-wave standard (MWS) designed for evaluating the frequency response in extracting surfaces with CT measuring systems. The characteristics of the MWS were defined using prior knowledge on MWS applied to CT and simulations of the CT extraction operation. With basis on the designed geometry, an aluminium MWS specimen was manufactured. A set of preliminary CT measurements demonstrate the suitability of the designed MWS to characterize the frequency response for surface extraction with CT systems.
- Keywords:
- dimensional metrology, industrial computed tomography, surface extraction, frequency response analysis
- Download:
- IMEKO-TC14-2013-PL-02.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC14
- Event name:
- TC14 ISMQC 2013
- Title:
11th International Symposium on Measurement and Quality Control
- Place:
- Cracow and Kielce, POLAND
- Time:
- 11 September 2013 - 13 September 2013