IMPLEMENTATION OF AN INPUT-OUTPUT METHOD OF DIAGNOSIS OF ANALOG ELECTRONIC CIRCUITS IN EMBEDDED SYSTEMS |
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| Zbigniew Czaja, Dariusz Zaleski |
- Abstract:
- In the paper an implementation of a new modified 2D bilinear method of fault detection and localisation of analog electronic circuits, taking into consideration tolerances of elements in embedded systems based on microcontrollers is described. This approach consists of two stages. In the first stage a fault dictionary consisting of a nominal area representing a fault-free circuit and coefficients defining widths of localisation belts are created. In the second stage the measurement procedure and the algorithm of fault detection and localisation is made by the microcontroller mounted in an embedded system. A new procedure of measurements of a voltage and a time delay by the microcontroller, the new fault detection and localisation algorithm, the practical verification of the measurement procedure and the fault diagnosis procedure will be presented.
- Keywords:
- fault diagnosis, embedded systems, microcontrollers
- Download:
- IMEKO-TC10-2005-28.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC10
- Event name:
- TC10 Conference 2005
- Title:
10th IMEKO TC10 Conference on Technical Diagnostics
- Place:
- Budapest, HUNGARY
- Time:
- 09 June 2005 - 10 June 2005