SPECTRAL INTERFEROMETRY WITH LATERAL CHROMATIC ENCODING |
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| Marc Gronle,Wolfram Lyda,Florian Mauch,Wolfgang Osten, David Fleischle |
- Abstract:
- In this paper, a new single-shot line sensor based on Fourier-domain spectral interferometry is presented. Each point of the sampled line is encoded by a different wavelength obtained by a chromatic dispersion at a grating. The requested height profile of the line is determined by combining a phase detection algorithm with an appropriate model-based approach. The robustness of this algorithm with respect to errors in the initial condition is analyzed before the final presentation of a measurement result.
- Download:
- IMEKO-TC14-2011-12.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC14
- Event name:
- TC14 LMPMI Symposium 2011
- Title:
10th Symposium on Laser Metrology for Precision Measurement and Inspection in Industry
- Place:
- Braunschweig, GERMANY
- Time:
- 12 September 2011 - 14 September 2011