USING OF PULSE SIGNAL Sinx/x FOR DAC TESTING |
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| Josef Vedral, Pavel Fexa |
- Abstract:
- In this paper the qualities of short methods for testing dynamical parameters internal ADCs and DACs with impulses Multi-Tone and Sinx/x signal are analyzed. Practically examples are compared with standard Single-Tone Fourier Transform Test Method. This methods finds an application in the industry in less demanding economical short testing.
- Download:
- IMEKO-IWADC-2011-13.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- IWADC 2011
- Title:
16th IMEKO International Workshop on ADC Modeling and Testing - Data Converter Design, Modeling and Testing (together with IEEE ADC Forum) (IWADC)
- Place:
- Orvieto, ITALY
- Time:
- 30 June 2011 - 01 July 2011