SELECTING SINEWAVE TEST FREQUENCIES FOR DYNAMIC ADC TESTS |
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| Milan Komárek, Jaroslav Roztočil |
- Abstract:
- The precise selection of the input and sampling frequencies, and selection of the record length are very important for dynamic testing of AD converters and modules by sine wave signal. IEEE Std 1241-2000 and Std 1057-2007 provide standardization in the ADC testing. Selection of optimal input testing signal frequency under these standards is resolved separately for applied deterministic testing methods. To compare results between each test method, it is necessary to use identical test conditions inclusive of identical input testing signal frequency. That is why an algorithm of input testing signal frequency selection was developed to allow both the sine-fit and the DFT methods to be applied.
- Download:
- IMEKO-TC4-2010-109.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- Instrumentation for the Information and Communication Technology Era
- Title:
- XVIIth IMEKO TC4 Symposium & 15th International Workshop on ADC Modelling and Testing (together with 3rd IMEKO TC19 Symposium)
- Place:
- Kosice, SLOVAKIA
- Time:
- 08 September 2010 - 10 September 2010