DIAGNOSIS OF NON-SCAN EMBEDDED ANALOG CLUSTERS BY MEANS OF THE MIXED-SIGNAL TEST BUS
M. Borkowska, R. Zielonko
Abstract:
Analog clusters embedded within a larger design which is equipped with IEEE Std 1149.4 mixed-signal test bus are usually non-scan user-defined circuits. Diagnosis of them by means the test bus is a significant challenge.
Virtual probes created by analog modules of the bus impact on the results of measurement but it can be avoided by properly strategy of diagnosis. Possibilities of diagnosis by means of the bus are increased by different modes of the bus operation. They are particularly useful for diagnosis of extended clusters.
Test features of the bus can appear non-sufficient in the presence of variety, sensitivity and limitation of access to the nodes of extended nonlinear analog clusters. Application of analytical method of diagnosis is then necessary.
The paper presents and discuss the results of investigation of the virtual probes of the IEEE Std 1149.4 test bus and non-scan clusters by means of the test bus collaborated with the CIM 97 Multidiatest Measurement and Diagnostic System.
Keywords:
diagnostics, mixed-signal test bus, analog circuit
Download:
IMEKO-WC-2000-TC10-P257.pdf
DOI:
-
Event details
Event name:
XVI IMEKO World Congress
Title:

Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

Place:
Vienna, AUSTRIA
Time:
25 September 2000 - 28 September 2000
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