INTERFERENCE ANALYSIS OF A LOW CURRENT MEASURING SYSTEM
F. Dietrich, U. Frühauf, E.-G. Kranz, H. Leuterer
Abstract:
Low current measurements are necessaries to characterise modern electronic components and for the investigation of different physical and bioelectrical effects. The currents are mostly in the region of a few picoamperes to some femptoamperes within temperatures between – 60 °C and above 200 °C. Special difficulties are caused by several parasitic effects, influenced by the design and the applied materials of the measuring system. The presented paper separates and examines these effects. The measured results are compared with the simulations. The analysis of the results give technical conditions how to avoid these interferences and how to improve the design of low current measuring system.
Keywords:
measurement system, interference analysis, low current
Download:
IMEKO-WC-2000-TC7-P181.pdf
DOI:
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Event details
Event name:
XVI IMEKO World Congress
Title:

Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

Place:
Vienna, AUSTRIA
Time:
25 September 2000 - 28 September 2000
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