ULTRA-LOW NOISE TWO CHANNEL NOISE MEASUREMENT SYSTEM
A. Konczakowska, L. Hasse, L. Spiralski
Abstract:
The computer-controlled system for low-frequency noise measurements has been presented. All major functions for adequate polarisation of a device under test are programmable providing complete flexibility and automation for biasing. The inherent noise parameters of the main modules are enclosed. The system enables to measure input-output noise relations for BJTs, JFETs, MOSFETs, MESFETs, HEMTs, and, in general, also other two-ports.
Keywords:
low-frequency noise, noise measurements, low- noise preamplifiers, automation of noise measurement
Download:
IMEKO-WC-2000-TC4-P136.pdf
DOI:
-
Event details
Event name:
XVI IMEKO World Congress
Title:

Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

Place:
Vienna, AUSTRIA
Time:
25 September 2000 - 28 September 2000
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