VIM AND CURRENT TENDENCIES IN MEASUREMENT SCIENCE

A. Chunovkina, K. Sapozhnikova, R. Taymanov
Abstract:
Some proposals with regard to the future version of the VIM are given. The proposals concern definitions of the terms "measurement", "nominal property", "metrological traceability", "sensor", "measuring system", etc. A necessity to apply measurements to new fields and take into account new technologies is grounded.
Keywords:
VIM, measurement, nominal property, metrological traceability, sensor, measuring system
Download:
IMEKO-WC-2012-TC7-O1.pdf
DOI:
-
Event details
Event name:
XX IMEKO World Congress
Title:

Metrology for Green Growth

Place:
Busan, REPUBLIC of KOREA
Time:
09 September 2012 - 12 September 2012