3-D SURFACE ROUGHNESS PROFILE OF 316-STAINLESS STEEL USING VERTICAL SCANNING INTERFEROMETRY WITH A SUPERLUMINESCENT DIODE |
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| Wirun Laopornpichayanuwat, Jakkapol Visessamit, Montian Tianprateep |
- Abstract:
- Surface roughness is one of many parameters that influences on mass stability of standard weight, commonly used as a transfer standard of mass SI unit. One of the most famous non-invasive methods for determining surface roughness from a surface profile of material is a vertical scanning interferometry (VSI) with a white light source. In this research, 3-D surface profiles of 316-stainless steel, usually used as a material for standard weights, are constructed by using VSI, based on Michelson interferometer (MI). Because of its low-coherent properties, low cost, and compact light source, a superluminescent diode (SLD) is chosen as a low-coherence light source in our interferometry system. Since a continuous wavelet transform (CWT) algorithm provides accuracy results, it is also used as a numerical analyzing method for the interferogram signals, taking from our VSI. The surface roughness and measurement uncertainty, calculated from the constructed 3-D surface roughness profiles of 316-stainless steel samples, are discussed.
- Keywords:
- roughness, vertical scanning interferometry (VSI), continuous wavelet transform (CWT)
- Download:
- IMEKO-TC3-2010-020.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC3
- Event name:
- TC3 Conference 2010
- Title:
21st Conference on Measurement of Force, Mass and Torque (together with TC5 HARDMEKO 2010 and 2nd TC22 Meeting on Vibration Measurement)
- Place:
- Pattaya, THAILAND
- Time:
- 21 November 2010 - 25 November 2010