MINIMIZATION OF THE UNEVEN SAMPLING EFFECTS ON EVALUATING ROUNDNESS WITH COORDINATE MEASURING MACHINES
Francisco Augusto Arenhart, Gustavo Daniel Donatelli, Mauricio de Campos Porath
Abstract:
This paper deals with the treatment of the uneven sampled data characteristic of high sampling rate roundness measurements on scanning coordinate measuring machines. Simulations using the sampling pattern presented by these machines and structured profiles resembling a multi-wave standard were performed for testing the response of several interpolation methods. The Lomb-Scargle transform for unevenly sampled data was tested for the same situations. A comparison between the techniques is carried out based on space and frequency domain characteristics of the simulated profile. Real measurements on a multi-wave standard were also performed on different machines to evaluate the behaviour of the measurement softwares with respect to the uneven sampling and to verify applicability of the simulated methods. Results show the improvements obtained on evaluated parameters with the use of the discussed techniques.
Keywords:
Scanning technology, roundness profile, uneven sampling
Download:
IMEKO-WC-2009-TC14-639.pdf
DOI:
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Event details
Event name:
XIX IMEKO World Congress
Title:

Fundamental and Applied Metrology

Place:
Lisbon, PORTUGAL
Time:
06 September 2009 - 11 September 2009
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