SINE WAVE SIGNAL SOURCES FOR TESTING HIGH-SPEED HIGH-RESOLUTION A/D CONVERTERS
Vaclav Papez, Jaroslav Roztocil, Stanislav Dado
Abstract:
The paper deals with conception of a sine wave signal generation for dynamic testing high-speed (1 MSa/s to 100 MSa/s) analog-to-digital converters with high-resolution (14 to 20 bits). An oscillator designed with respect to minimal phase noise is described.
Keywords:
ADC testing, phase noise, SINAD, THD
Download:
IMEKO-WC-2009-TC4-484.pdf
DOI:
-
Event details
Event name:
XIX IMEKO World Congress
Title:

Fundamental and Applied Metrology

Place:
Lisbon, PORTUGAL
Time:
06 September 2009 - 11 September 2009
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