BIAS IN ADC TERMINAL BASED GAIN AND OFFSET ESTIMATION USING THE HISTOGRAM METHOD |
|---|
| F. Corrêa Alegria |
- Abstract:
- It is demonstrated that, when using the Histogram Test Method to test an analogue to digital converter, the presence of additive noise in the test setup or in the converter itself causes a bias in the terminal based estimation of the gain but not in the estimation of the offset. This will be demonstrated here by analytically determining the estimation error as a function of the sinusoidal stimulus signal amplitude and the noise standard deviation. A closed form approximate expression will be proposed for the computation of the bias of terminal based gain. The results presented are numerically validated using a Monte Carlo procedure.
- Keywords:
- Analogue to Digital Converter, Histogram Test Method, Estimator Bias
- Download:
- IMEKO-WC-2009-TC4-472.pdf
- DOI:
- -
- Event details
- Event name:
- XIX IMEKO World Congress
- Title:
Fundamental and Applied Metrology
- Place:
- Lisbon, PORTUGAL
- Time:
- 06 September 2009 - 11 September 2009