NOVEL HIGH-RESOLUTION INTERFEROMETRIC MATERIALS TESTING DEVICE FOR THE DETERMINATION OF THE VISCOELASTIC BEHAVIOUR OF HIGH-TECH PLASTICS |
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| Michael Kühnel, Falko Hilbrunner, Gerd Jäger |
- Abstract:
- The use of high-tech plastics in the field of mechanical engineering is increasing dramatically. The time-dependent change of strain ε(t) during constant load (viscoelasticity, creeping) is a fundamental property of plastics and exact knowledge of these properties is required for the design of plastic parts. A novel high-resolution materials testing device is presented in this paper. It offers reaction-free interferometric measurement of the viscoelastic behaviour of plastics at a constant bending load. The resolution of the deflection is 1 nm.
Therefore, unlike the three point bending test described in the ISO 899-2:2003 standard, the device is suitable for the measurement of viscoelasticity ε(t) at very small strain values (εmax < 0.1 %) and after a very short loading time (t < 1 d).
A detailed description of the device and the parameters is shown as well as measurements of the time-dependent strain ε(t) of a high-tech plastic. Very good reproducibility of the measurements was achieved, which makes the device very suitable for measuring viscoelastic behaviour. - Keywords:
- plastic, viscoelasticity, creep
- Download:
- IMEKO-WC-2009-TC3-212.pdf
- DOI:
- -
- Event details
- Event name:
- XIX IMEKO World Congress
- Title:
Fundamental and Applied Metrology
- Place:
- Lisbon, PORTUGAL
- Time:
- 06 September 2009 - 11 September 2009