STATISTICAL ANALYSIS OF THE WORD ERROR RATE MEASUREMENT IN ANALOG-TO-DIGITAL CONVERTERS
Marcantonio Catelani, Andrea Zanobini, Lorenzo Ciani
Abstract:
The word error rate (WER) in an Analog to Digital Converter (ADC) is the probability to receive a wrong code for an input, after correction is made for gain, offset, and nonlinearity errors, and a specified allowance is made for noise. Typical causes of word errors are metastability and timing jitter of comparators within the ADC.
The proposed paper is an evolution of previous work and focuses the attention to the word error rate estimation and to the Annex A of IEEE standard 1241. Other statistical techniques, which can better integrate what is sustained in the standard and in [2], have been proposed. In particular, Chi-square and F distributions have been introduced for a more accurate measurement of the word error rate in the case of n successive observations.
Keywords:
Analog to Digital Converter (ADC), IEEE Std 1241, Word Error Rate (WER)
Download:
IMEKO-WC-2009-TC4-204.pdf
DOI:
-
Event details
Event name:
XIX IMEKO World Congress
Title:

Fundamental and Applied Metrology

Place:
Lisbon, PORTUGAL
Time:
06 September 2009 - 11 September 2009
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