ADVANCED ADC TESTING BY MULTIEXPONENTIAL STIMULI |
|---|
| Linus Michaeli, Jan Saliga, Michal Sakmar, Jan Busa |
- Abstract:
- The paper presents a new approach to ADC histogram test by exponential stimulus signal. The basic, early published, method based on simple exponential stimulus can hide some low code frequency errors in ADC integral nonlinearity. This effect is caused by estimation method of exponential stimulus. The authors proposed new advanced method in processing of histograms achieved by exponential stimulus signal. The basic idea of the new method is in application of periodical exponential stimulus signal consisting of rising and falling parts within its period. Subsequently the estimation of INL is done by minimising of cost function given by the difference between INLs calculated for rising and falling part of signal. Performed simulations and experimental results show that the suggested method is usable in real measurement and it is not more complex in comparison with basic exponential stimulus test method both in hardware realisation and in data processing algorithm.
- Keywords:
- ADC measurement, estimation of INL, exponential stimulus signal
- Download:
- IMEKO-WC-2009-TC4-191.pdf
- DOI:
- -
- Event details
- Event name:
- XIX IMEKO World Congress
- Title:
Fundamental and Applied Metrology
- Place:
- Lisbon, PORTUGAL
- Time:
- 06 September 2009 - 11 September 2009