HIGH-QUALITY LOW-COST LOW-FREQUENCY FILTER FOR ADC TESTING

Vladimir Haasz, David Slepicka
Abstract:
This paper deals with the generation of low-distortion sine wave signal by means of low-cost filter for the purpose of ADC testing at the signal frequency of 20 kHz. The design and manufacture of such a filter is proposed and the functionality of a prototype is verified on a top digitizer.
Keywords:
ADC testing, low-distortion signal, signal filtering
Download:
IMEKO-WC-2009-TC4-139.pdf
DOI:
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Event details
Event name:
XIX IMEKO World Congress
Title:

Fundamental and Applied Metrology

Place:
Lisbon, PORTUGAL
Time:
06 September 2009 - 11 September 2009