STATIC CHARACTERIZATIONS OF ANALOG TO DIGITAL CONVERTER |
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| Patrick Espel, Andre Poletaeff |
- Abstract:
- This paper deals with the assessment of the metrological performance of analog-to-digital converters in order to use them in some metrology applications. Hence, digitizers of a commercial DVM have been characterized under DC voltages, with respect of several parameters such as aperture time, dead time and the autozero function.
- Keywords:
- digitizers, aperture time, sampling techniques
- Download:
- IMEKO-WC-2009-TC4-138.pdf
- DOI:
- -
- Event details
- Event name:
- XIX IMEKO World Congress
- Title:
Fundamental and Applied Metrology
- Place:
- Lisbon, PORTUGAL
- Time:
- 06 September 2009 - 11 September 2009