TESTING METHOD OF ANALOG PARTS FOR MIXED SIGNAL MICROSYSTEMS BASED ON MICROCONTROLLERS
Zbigniew Czaja
Abstract:
In the paper a new method of fault detection and location of a single soft fault in analog parts of mixed signal microsystems based on microcontrollers is presented. The idea of the method bases on the transformation which maps changes of the time response of the tested circuit on a square impulse resulting from changes of values of respective elements onto identification curves on a plane. The method consists of two stages. In the first stage a fault dictionary of an analog part in the form of a family of identification curves is generated and it is placed in the program memory of the microcontroller. In the second stage detection and a location of the fault are carried out.. This method does not require extra hardware in the microsystem. The measuring-diagnosis procedure is realised only by the microcontroller already existing in the microsystem.
XIII IMEKO TC4 International Symposium on Measurements for Research and Industrial Applications (together with IXth International Workshop on ADC Modeling and Testing, IWADC)
