TEST LIMITATIONS INDUCED BY FAULT-DRIVEN INSTABILITY OF ANALOG CIRCUITS
Wojciech Toczek
Abstract:
The aim of this paper is to estimate the limitations of parametric faults testing in analog circuits result from fault-driven instability. The linear fractional transformation (LFT) and structured singular value (SSV), the analysis methods from robust control theory, are employed to investigate which parameter could lead to instability of a circuit under test (CUT), and to quantify the deviation in component parameter value that will cause instability. The leapfrog filter is studied as CUT. The SSV based analysis procedure is applied to a Simulink model, which is realized as LFT representation of faulty circuit. Numerical results show that leapfrog filter is highly susceptible to lose stability due to faulty RC elements.
XIII IMEKO TC4 International Symposium on Measurements for Research and Industrial Applications (together with IXth International Workshop on ADC Modeling and Testing, IWADC)
