DEVELOPMENT OF INNOVATIVE METHODS FOR CHARACTERIZING, MODELING AND CORRECTING THE NON-IDEAL BEHAVIOR OF A/D AND D/A CONVERSION CHANNELS, IN ORDER TO CONTRIBUTE TOWARDS HARMONIZING AND UPGRADING INTERN

AA. VV.
Abstract:
The research program aims at improving the performance of appliances based on Analog-to-Digital and Digital-to-Analog conversion (ranging from measuring instruments to on-chip ADC and DAC). This will be done by developing methods for the accurate measurement and correction of conversion errors (including, when applicable, errors caused by transducers and signal-conditioning blocks). Another aim of the research is to expand the scope of the theory of measurement uncertainty, including conversion errors in dynamic conditions. This will allow the manufacturers to qualify correctly the non-ideality of a conversion channel in the specifications, and the users to use correctly the given figures to compute the uncertainty introduced by the conversion. The research, developed for the parts of competence by the five coordinated Units, aims also at contributing in real terms towards the improvement and the harmonization of the existing standards, which currently present various discrepancy and obvious deficiencies with respect to the state of the art.
Download:
IMEKO-IWADC-2008-213.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
IWADC 2008
Title:

13th IMEKO TC4 Workshop on ADC Modelling and Testing IWADC (together with XVIth IMEKO TC4 International Symposium on Electrical Measurements and Instrumentation) (IWADC)

Place:
Florence, ITALY
Time:
22 September 2008 - 24 September 2008