ACTIVE BIAS NETWORK-BASED MEASUREMENT SET-UP FOR THE DIRECT CHARACTERIZATION OF LOW-FREQUENCY NOISE CURRENTS IN ELECTRON DEVICES |
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| Corrado Florian, Pier Andrea Traverso |
- Abstract:
- A technology-independent set-up for the full and direct characterization of short-circuit low-frequency noise currents in two-port electron devices is presented. It is based on the use of low-noise transimpedance amplifiers and a specially-designed active bias network, adopted at the collector/drain port of the device. The features of the set-up proposed allow for a fast and accurate estimation of LF noise current power spectra, within a wide range of DC current bias levels, without the need for any reconfigurations and by carrying out a single-step procedure to achieve each bias point of interest.
- Download:
- IMEKO-TC4-2008-161.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements
- Title:
- XVIth IMEKO TC4 International Symposium on Electrical Measurements and Instrumentation (together with 13th IMEKO TC4 Workshop on ADC Modelling and Testing)
- Place:
- Florence, ITALY
- Time:
- 22 September 2008 - 24 September 2008