MEASURING DETERMINISTIC JITTER USING TIME INTERVAL MEASUREMENT SYSTEM |
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| S. Grzelak, M. Zieliński, D. Chaberski |
- Abstract:
- This paper describes the method of analysis of the measuring data obtained from low resolution and non-linear Time Interval Measurements System (TIMS) implemented in to FPGA device. Information about quantization and nonlinearity errors of TIMS warrants more precise analytical results during deterministic jitter investigation. The probability density function of the time-interval fluctuation can be very helpful during diagnosing of the jitter sources. As source of signal with deterministic jitter was used digital Delay Locked Loop (DLL) block, embedded in Virtex-E device. The TIMS with the suitable processing of the data allows observe and measure peak-to-peak value of deterministic jitter on the level of resolution of TIMS.
- Download:
- IMEKO-IWADC-2008-125.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- IWADC 2008
- Title:
13th IMEKO TC4 Workshop on ADC Modelling and Testing IWADC (together with XVIth IMEKO TC4 International Symposium on Electrical Measurements and Instrumentation) (IWADC)
- Place:
- Florence, ITALY
- Time:
- 22 September 2008 - 24 September 2008