ADC CHARACTERIZATION BY DYNAMIC INTEGRAL NONLINEARITY |
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| Samer Medawar, Peter Händel, Niclas Björsell, Magnus Jansson |
- Abstract:
- Wide band characterization of analog-digital converter integral nonlinearity (INL) based on parametric modeling and least-squares parameter fit is performed. In particular, the variations in the INL due to the frequency at the ADC stimuli are modeled. The INL is divided into two main entities describing the static and dynamic behavior of the ADC, respectively. The static component is modeled by a high code component (HCF) of piecewise linear segments centered around zero. A static low code (LCF) polynomial inherent to the INL data is added to the segments to describe the static part of the model. The INL dynamic part is modeled by an LCF polynomial. Method implementation is considered and is applied to 12-bit ADC data at 210 MSPS.
- Download:
- IMEKO-IWADC-2008-023.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- IWADC 2008
- Title:
13th IMEKO TC4 Workshop on ADC Modelling and Testing IWADC (together with XVIth IMEKO TC4 International Symposium on Electrical Measurements and Instrumentation) (IWADC)
- Place:
- Florence, ITALY
- Time:
- 22 September 2008 - 24 September 2008