METROLOGICAL SELF-CHECK AND EVOLUTION OF METROLOGY
Roald Taymanov, Ksenia Sapozhnikova
Abstract:
Indications of the crisis in the conventional methods of metrological assurance of sensors are analyzed. The analogy between biological and technical evolutions is discussed. It is shown that the near future is mass production of intelligent sensors and systems with metrological selfcheck, as well as the transition to a new stage in evolution of metrological assurance of sensors.
Keywords:
sensor, metrological self-check of sensors, long term calibration interval, evolution of metrology
Download:
IMEKO-TC1-TC7-2008-027.pdf
DOI:
-
Event details
IMEKO TC:
TC7
Event name:
TC1 & TC7 Conference 2008
Title:

12th IMEKO TC1 & TC7 Joint Symposium on "Man, Science & Measurement" (TC7)

Place:
Annecy, FRANCE
Time:
03 September 2008 - 05 September 2008
 Back