MECHANICAL CHARACTERIZATION OF MATERIAL COATINGS USING THE FISCHERSCOPE H100 (R) COMPACT |
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| P. Neumaier, G. Michalzik |
- Abstract:
- The load/indentation depth method has received broad acceptance both in quality control and in research and product development for characterizing the mechanical behavior of thin coatings and also of small and smallest material areas. Continuous high-resolution recording of test load and indentation depth for the full test cycle (loading and unloading) is used in a variety of ways in particular for test loads in the microhardness range. Contributing factors to its acceptance were the greater information content of the measurement results, the operator-independent test procedure and the speedy standardization of the test method. However, until now, the use of the instrumented indentation test has been limited to relatively small specimens or required the supply of small samples. Extracting a sample leads to the destruction of the product, and the separate production of a sample requires additional expenditures and does not always ensure comparable properties. The computer-controlled Fischerscope® H100 Compakt (H100 C) opens entirely new areas of applications for efficient tests of materials and thin coatings both on small samples/micro components and on large specimens such as coated shafts, forming components, etc. Using selected examples, this paper reports about the capabilities of this new measurement technology for applications with small test loads and indentation depths as well as the use of the mobile measuring head H100SMC on large-area and compact specimens.
- Download:
- IMEKO-TC5-2002-020.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC5
- Event name:
- Joint International Conference on Force, Mass, Torque, Hardness and Civil Engineering Metrology in the age of globalization
- Title:
- 8th HARDMEKO Conference on Hardness Measurement (together with 18th TC3 Conference on Force, Mass and Torque and 1st TC20 Conference on Civil Engineering Metrology)
- Place:
- Celle, GERMANY
- Time:
- 24 September 2002 - 26 September 2002