SINE-WAVE SIGNAL SOURCES FOR DYNAMIC TESTING HIGH-RESOLUTION HIGH-SPEED ADCs |
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| Milan Komarek, Vaclav Papez, Jaroslav Roztocil, Petr Suchanek |
- Abstract:
- The paper deals with methods of a sine-wave signal generation for dynamic testing high-speed (1 MSa/s to 100 MSa/s) ADCs with high resolution (14 to 20 bits). The techniques of noise and distortion measurement of spectrally-pure sine-wave signals are also discussed.
- Keywords:
- sine-wave signal distortion measurement, dynamic ADC testing
- Download:
- PWC-2006-TC4-IWADC-003u.pdf
- DOI:
- -
- Event details
- Event name:
- XVIII IMEKO World Congress
- Title:
Metrology for a Sustainable Development
- Place:
- Rio de Janeiro, BRAZIL
- Time:
- 17 September 2006 - 22 September 2006