DYNAMIC CHARACTERIZATION OF A/D CONVERTERS BY RAMP TESTING SIGNALS |
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| Daniel Belega, Dominique Dallet |
- Abstract:
- In this paper a method for evaluation the dynamic performances of an analog-to-digital converter (ADC) by ramp testing signals is proposed. This method permits the estimation with high accuracy of ones of the most important dynamic parameters of an ADC – signal-to-noise and distortion ratio (SINAD) and effective number of bits (ENOB). Carried out simulations confirm that the proposed method leads to accurate results.
- Keywords:
- ramp signals, modulo time-plot, estimation of the dynamic parameters SINAD and ENOB of an ADC
- Download:
- PWC-2006-TC4-IWADC-001u.pdf
- DOI:
- -
- Event details
- Event name:
- XVIII IMEKO World Congress
- Title:
Metrology for a Sustainable Development
- Place:
- Rio de Janeiro, BRAZIL
- Time:
- 17 September 2006 - 22 September 2006